USIF/MSE/ARL Short Course
Scanning Electron Microscopy
June 16 - June 20, 2008
The short course will meet in Mines 133, 10:00-12:00 AM, for lecture sections. Lab sessions will meet in Marley Suite 101, 1:00-4:00 PM. Students will be required to pass a practical examination on an instrument before they will be allowed access to schedule time and operate the instrument. This course or equivalent is required for researchers to access the USIF scanning electron microscopes.
Cost: $1250.00 Paid in advance. Includes 4 hours of supervised instrument time on students own research samples during 6/23/08-6/27/08. A minimum of four students is required for the course to be offered.
Schedule:
| 6/16 AM | SEM Basics, Electron Optics |
| 6/16 PM | Operation Procedures |
| 6/17 AM | Electron Beam/Sample Interactions, Contrast Mechanisms |
| 6/17 PM | Practical SEM Operations |
| 6/18 AM | Field-Emission SEM, Low Voltage, Ultra-High Resolution |
| 6/18 PM | Low Voltage, High Resolution, Variable Pressure |
| 6/19 AM | Variable Pressure, Sample Preparation |
| 6/19 PM | STEM, Energy Filtered Detector, Problem Samples |
| 6/20 AM | X-ray Analysis in SEM, CL, Raman, EBSD |
| 6/20 PM | X-ray Analysis, Elemental Imaging |
| 6/23 - 6/27 | Individual Yime with a USIF Staff |
To REGISTER, Contact:
Gary Chandler gwc@u.arizona.edu 520-237-7259
David Bentley dlb@u.arizona.edu 520-621-5079
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