USIF/MSE/ARL Short Course
Scanning Electron Microscopy
January 22-February 22, 2008
The short course will meet concurrently with MSE488/588 in Mines 215 for all lecture sections. Lab sessions will meet in Mines 159, 161, and Marley 101. Students will be required to pass a practical examination on an instrument before they will be allowed access to schedule time and operate the instrument. This course or equivalent is required for researchers to access the USIF scanning electron microscopes.
Cost: $1250.00 Includes 4 hours of supervised instrument time on students own research samples during 2/19-2/22. Must be paid in advance.
Schedule:
| 1/22, 8:00-9:00 AM | Introduction |
| 1/24, 8:00-9:00 AM | Electron Optics |
| 1/28, 2:00-5:00 PM | Lab 1: Operation Procedures |
| 1/29, 1/31 8:00-9:00 AM | Image Formation |
| 2/4, 2:00-5:00 PM | Lab 2: Beam Parameters; Imaging Strategy |
| 2/5, 2/7 8:00-9:00 AM | Beam/sample Interactions |
| 2/11, 2:00-5:00 PM | Lab 3: Digital Imaging |
| 2/12, 2/14, 8:00-9:00 AM | Field Emission SEM; Variable Pressure SEM |
| 2/18, 2:00-5:00 pm | VP SEM, FE SEM, Choose instrument |
| 2/19-2/22 | Individual scope time and practical examination Sample preparation |
To REGISTER, Contact:
Gary Chandler gwc@u.arizona.edu 520-237-7259
David Bentley dlb@u.arizona.edu 520-621-5079
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