Remote Trans-Pacific Collaborative Spectroscopy Training Workshop conducted by USIF
June 11th-13th, 2008
Workshop on “Remote Operation Across the Pacific of Scanning Electron Microscopy and Optical Raman Spectroscopy Performed Simultaneously”
By: Prof. Supapan Seraphin, Director of University Spectroscopy and Imaging Facilities (USIF), Department of Materials Science and Engineering, seraphin@email.arizona.edu, and Steven Hernandez, USIF, sahernandez2@gmail.com, University of Arizona, Tucson, Arizona 85721
In collaboration with: Thailand Metal and Materials Technology Center (MTEC)
Objectives:
The Introductory Workshop will provide the attendees (up to 100 people) with an overview of the basic principles, advantages, limitations, and applications of scanning electron microscopy (SEM) and Raman spectroscopy. The latest technology development of combining these two techniques will be introduced.
The Intensive Hands-on Training will provide attendees (15 people), who have worked directly with SEM and/or Raman spectroscopy, with a working knowledge and practical aspects of the combined techniques.
Program:
Wednesday, 11 June 2008 (both groups)
8:00 – 8:30 Registration
8:30 – 8:45 Opening and welcome remark (MTEC Director)
8:45 – 9:30 Introduction to SEM
9:30 – 10:30 Demonstration: Real-time remote access to SEM/Raman and FESEM/EDS in Arizona through TaiPAN system
10:30-11:00 Coffee break
11:00-12:00 SEM Basic (Image contrast mechanisms)
12:00-1:00 Lunch
1:00 – 2:30 Field-emission SEM, Low-voltage SEM, Variable-pressure SEM
2:30 – 3:00 Coffee break
3:00 – 4:00 Raman spectroscopy basic, advantages/disadvantages of combined SEM
4:00 – 5:00 Tour MTEC facilities
Thursday, 12 June 2008 (Intensive hands-on training on conventional SEM)
8:30 – 9:00 Introduction
9:00 – 10:00 Remote access to Arizona SEM3400 (analysis of carbon nanotubes with SEM, Raman, and EDS Spectral imaging)
10:00-10:30 Coffee break
10:30-12:00 Optimization of beam parameters (electron guns and electron optics)
12:00-1:00 Lunch
1:00 – 2:30 Contrast mechanisms (SE, BSE-topographic and compositional)
2:30 – 3:00 Coffee break
3:00 – 4:30 Sample preparation (charging, coating, mounting samples, prep for EDS, BSE analysis)
Friday, 13 June 2008 (Intensive hands-on training on field-emission SEM)
8:30 – 10:00 Field-emission gun, electron optics (snorkel lens, through the lens detectors, beam monitor aperture), energy filter
Low-voltage SEM
10:00-10:30 Coffee break
10:30-12:00 Energy Dispersive X-ray Spectroscopy (EDS)-geometry, count rate, qualitative and quantitative analysis
12:00- 1:00 Lunch
1:00 – 2:30 Basic maintenance (changing filament, aperture cleaning, vacuum trouble shooting)
2:30-3:00 Coffee break
3:00-4:00 Tips on analysis of “difficult” samples
4:00-4:30 Questions and Answers
4:30-5:00 Evaluation and closing
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