The University of Arizona

University Spectroscopy and Imaging Facilities

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Services

We provide multi-user access to equipment, and the knowledge and skills necessary to assist investigators and students in state-of-the-art technologies. Access also include operator assisted services.

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USIF NORTH- Arizona Health Sciences Center Imaging (AHSC Imaging)

USIF (Main Campus)

* Scanning Electron Microscopy

> Field Emission SEM
> Variable Pressure SEM

* Transmission Electron Microscopy

> Physical and Biological TEM

* X-ray Diffraction

* Professional Assistance and Collaborations

* Education and Training

* Outreach

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Scanning Electron Microscopy

Scanning Electron Microscopy (SEM) can provide high magnification, high resolution, images of samples at magnifications from 5x to 300,000x. Our instruments are all equipped with ThermoNORAN microanalyzers for energy dispersive spectroscopy (EDS).

Field-Emission SEM

Hitachi S-4800 Type II / ThermoNORAN NSS EDS

S-4800
more info on the S-4800

Cold field emission electron gun; Resolution 1nm at 15 KV, 1.4nm at 1KV; Magnification 20X to 800,000X; Imaging voltages 100V to 30KV; STEM detector; BSE low and/or high angle; EDS detection range Boron and higher; full EDS capabilities including spectral imaging, qualitative and quantitative analysis.

| RATES | Access | CONTACT |

Hitachi S-4500 / ThermoNORAN NSS EDS

Hitachi S-4500
more info on the S-4500

1.5 nm resolution, 0.5 - 30 kV accelerating voltage, 3 stage electromagnetic lens, 2 secondary electron detectors, 1 backscattered electron detector, x-y-z translation, -5 degrees to + 45 degrees tilt, 360 degree rotation (continuous) 50 mm diameter specimen size; full EDS capabilities including spectral imaging, qualitative and quantitative analysis.

| RATES | Access | CONTACT |

Variable Pressure SEM

Hitachi S-3400N Type II / ThermoNORAN NSS EDS

S-3400
more info on the S-3400N

Tungsten thermionic emitter, Quad Bias; Resolution 30nm at 3KV, 3nm at 30KV; SE and BSE; Samples as tall as 30mm; Chamber pressure 6 to 270 Pa in variable pressure mode; EDS detection range Boron and higher; full EDS capabilities including spectral imaging, qualitative and quantitative analysis.

| RATES | Access | CONTACT |

The Hitachi S-3400N is equipped with a Raman, Cathodeluminescent (CL) and Photolumnescence (PL) Spectrometer: Renishaw Structural and Chemical Analyzer (SCA)

renishaw

renishaw

renishaw
more info on the S-3400N

InVia Raman Spectrometer; 514nm, 50mW laser; CL Spectrometer from 400 to 1060nm.

| RATES | Access | CONTACT |

Hitachi S-2460 / ThermoNORAN NSS EDS

Hitachi S-2460
more info on the S-2460

Tungsten thermionic emitter, SE and BSE; Samples as tall as 30mm; Chamber vacuum 0.01-2 Torr in variable pressure mode; EDS detection range Boron and higher; full EDS capabilities including spectral imaging, qualitative and quantitative analysis.

| RATES | Access | CONTACT |

Transmission Electron Microscopy

Hitachi H-8100

Hitachi H8100
more info on the H-8100

The Hitachi H8100 is a 200kV conventional TEM with high brightness LaB6 electron source and large specimen-tilt (> 30 degrees) capabilities. It offers phase contrast resolution of better than 0.26 (point) and 0.14 nm (line). It is equipped with small probe forming lenses for nanodiffraction, CBED and hollow-cone illumination. A heating stage (up to 1000C) and a LN2 cooling stage coupled with CCD high resolution camera allows unique dynamic in-situ experiments.

| RATES | Access | CONTACT |

JEOL 100 CX II

JEOL 100 CX II

100X-200,000X. Good resolution with excellent screen contrast. Film based data collection.

| RATES | Access | CONTACT |

X-ray Diffraction (XRD)

Scintag XDS 2000 PTS Diffractometer

Scintag XDS 2000
more info on the Scintag XDS 2000

The Scintag XDS 2000 PTS Diffractometer is capable of analyzing a broad range of materials including but not limited to plastics, metals, semiconductors, minerals and pharmaceutical materials.

| RATES | Access | CONTACT |

Professional Assistance and Collaborations

The USIF staff can assist in the following:

  • * Consulting
    * Adapting published techniques
    * Developing new techniques
    * Assisting with procedures
  • | RATES | CONTACT |

 

Education and Training

Training regarding any aspect of spectroscopy and microscopy is available. We will provide you with hands-on training to operate and optimize the systems for the type of samples that you will be working with through classes and workshops.

Information about new techniques, instrumentation and applications of electron microscopy is provided through USIF sponsored workshops and seminars. All events are open to investigators in academia, private and public institutions and industry. Some UA courses are offered.

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  • Outreach

Camp

  • We strongly support K-12 science education and provide mentoring to students interested in doing science projects. We offer summer camps to enhance learning in the life and physical sciences. Camp activities are coordinated through the Division of Biotechnology Outreach Program.

  • | CONTACT |

Research and Industrial Clients - Contact Us

Call Us

David Bentley: 520-621-5097, dlb@u.arizona.edu

Gary Chandler: 520-621-6078, gwc@u.arizona.edu

Phil Anderson: 520-322-2308, pla@u.arizona.edu


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