Ultra-High Resolution Field Emission-SEM S-4800
Overview
" The Hitachi S-4800 is a truly versatile platform comprising impressive high resolution performance, advanced detection technology, and a user interface that makes it possible to capture even the most short lived moments accurately and clearly.
It employs a semi-in-lens design for large sample accommodation while achieving ultra-high resolution comparable to performance only available with in-lens UHR SEMs.
Features
A new objective lens design with "Super ExB Filter" technology. Using a single detector, the Super ExB Filter collects and separates the various components of pure SE, compositional SE and BSE electron signals.
A guaranteed resolution of 1.4 / 2.0 nm at 1kV (deceleration / standard mode) for low voltage applications.
Type II specimen stage for large sample applications with 110mm x 110mm stage movement and computer controlled 5 axes motorization with graphical interface software.
Advanced dry vacuum system design including Turbo Molecular Pump (TMP).
A new GUI design developed in consultation with users making the S-4800 the most advanced, user friendly UHR SEM available today."
Specifications
Secondary electron image resolution |
1.0nm (at 15kV) |
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Electron optics |
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Electron gun |
Cold field emission electron source |
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Acc. voltage |
0.5 - 30kV (variable at 0.1kV/step) |
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Magnification |
X 20 - X 800.000 |
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Objective aperture |
4 opening, selectable and alignable outside the vacuum (Heater built-in) |
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Detectors |
Secondary electron detector (upper/lower/upper + lower), |
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Specimen stage |
Type II |
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Drive: |
PC controlled 5 axes motor drive |
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Image display |
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Operation/display |
PC/AT compatible, OS: Windows XP |
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Scan mode |
Normal, Split/dual mag./line scan, position |
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Frame memory |
640 x 480 pixels, 1,280 x 960 pixels, |
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Image processing |
Image processing software, image filing software built-in |
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Image file format |
BMP, TIFF, JPEG selectable |
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Scan speed |
TV, slow (0.5 ~ 40 s/frame) for viewing |
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Image processing |
Automatic image brightness & contrast, |
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Auto data recording |
Film numbering, acc. voltage, micron bar |
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Electrical image shift |
+/-12 um (at W.D. = 8mm) |
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Vacuum system |
Fully automated pneumatic valve control |
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Options - Thermo
NanoTrace LN-Cooled Si(Li) Detector
The no compromises solution to high sensitivity,
high resolution X-ray detection:
Excellent low energy performance
ISO 15632 compliance
Guaranteed performance on the electron microscope:
- Dewar capacities is 10 liters
* Mn resolution down to 129 eV
* F resolution down to 65 eV
* C resolution down to 62 eV
Light element detection down to beryllium
"Thermo Scientific: The Spectral Imaging Brand
Over the past years, we have placed collecting and analyzing Spectral Imaging data at the core of the NORAN System SIX Microanalysis System. While others have developed look-alike features, only Thermo has developed a set of tools exclusively designed for Spectral Imaging data.
Automated Acquisition Parameters -- Eliminates guesswork and trial-and-error data collection
Quantitative X-ray Mapping -- Produces richer elemental distribution data
COMPASS -- Multivariate statistical analysis software producing "pure" components
Xphase -- Analyzes X-ray data to produce phase distributions
Spectral Match -- Matches spectral data with known alloys and compounds
When combined, these tools present a comprehensive analysis of the sample's composition, not just in terms of elemental distribution (x-ray maps), but as a complete representation of the sample's composition including the identification of compounds and alloys.
Introducing Direct-to-Phase
Using these advanced algorithms, Direct-to-Phase extracts and displays known phases while the data is still being collected. Now you can allow your EDS system to decide when sufficient statistics have been collected, or you can visualize the data as it develops.
Direct-to-Phase combines Thermo's advancements in Spectral Imaging analysis to produce the most comprehensive tool for understanding your sample's composition. Direct-to-Phase does much more than simply present elemental data in maps and spectra. It develops an information-rich picture of your sample's composition. And it produces complete data ten times faster than current X-ray microanalysis technology.
Research and Industrial Clients - Contact Us
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David Bentley: 520-621-5097, dlb@u.arizona.edu Gary Chandler: 520-621-6078, gwc@u.arizona.edu |
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