Hitachi S-4500 Field Emission Scanning Electron Microscope
The S-4500 is a cold field emission SEM with advanced high resolution imaging at low voltage operation (capable of <1 kV), digital image processing, versatile sample chamber and stage design, and thoroughly computer controlled electronics.
The S-4500 has an objective lens and secondary electron detector design which provides excellent imaging resolution, particularly in low voltage operation. The S-4500 has a built-in recursive frame memory which enhances signal to noise ratio and permits crystal clear images on CRT monitors at flicker-free TV-scan rates. This facilitates field selection, focusing, and astigmatism correction.
Specification
- * 1.5 nm resolution
- * 0.5 - 30 kV accelerating voltage
- * 3 stage electromagnetic lens
- * 2 secondary electron detectors
- * x-y-z translation, -5 degrees to + 45 degrees tilt, 360 degree rotation (continuous) 50 mm * diameter specimen size
- * full EDS capabilities including spectral imaging, qualitative and quantitative analysis.
Research and Industrial Clients - Contact Us
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Gary Chandler: 520-621-6078, gwc@u.arizona.edu |
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