S-2460 Variable Pressure SEM
Hitachi S-2460N Scanning Electron Microscope
Hitachi S-2460N Scanning Electron Microscope Conventional high vacuum plus "Variable Pressure" scanning electron microscopy in low vacuum conditions with or without speciman preparation. Thermo Noran System Six provides digital imaging,
spectral imaging, and full qualitative and quantitative x-ray analysis.
- Specification
- * Resolution (high vacuum mode): 4 nm
- * Resolution (low vacuum mode): 6 nm
- * Magnification: x20 ~ 200,000 (41 steps)
- * Accelerating voltage: 0.5 ~ 25 kV (39 steps)
- * Sample size: 150 mm in diameter (max)
- * EDS detector for X-ray microanalysis
- * Mode selector: Automatic (Menu Control)
- * SE/BSE detector selection: Automatic (Menu Control) Operating vacuum in V.P. mode: 1.0 ~ 270 Pa (0.01 ~ 2 Torr) in sample chamber
NORAN System SIX X-ray Microanalysis System
(information from the Hitachi web site)
Thermo Scientific: The Spectral Imaging Brand
Over the past years, Thermo Scentific has placed collecting and analyzing Spectral Imaging data at the core of the NORAN System SIX Microanalysis System. While others have developed look-alike features, only Thermo has developed a set of tools exclusively designed for Spectral Imaging data.
Automated Acquisition Parameters -- Eliminates guesswork and trial-and-error data collection
Quantitative X-ray Mapping -- Produces richer elemental distribution data
COMPASS -- Multivariate statistical analysis software producing "pure" components
Xphase -- Analyzes X-ray data to produce phase distributions
Spectral Match -- Matches spectral data with known alloys and compounds
When combined, these tools present a comprehensive analysis of the sample's composition, not just in terms of elemental distribution (x-ray maps), but as a complete representation of the sample's composition including the identification of compounds and alloys.
Introducing Direct-to-Phase
Using these advanced algorithms, Direct-to-Phase extracts and displays known phases while the data is still being collected. Now you can allow your EDS system to decide when sufficient statistics have been collected, or you can visualize the data as it develops.
Direct-to-Phase combines Thermo's advancements in Spectral Imaging analysis to produce the most comprehensive tool for understanding your sample's composition. Direct-to-Phase does much more than simply present elemental data in maps and spectra. It develops an information-rich picture of your sample's composition. And it produces complete data ten times faster than current X-ray microanalysis technology.
New SDD X-ray Detector Improves Throughput and Reduces Sample Damage
Thermo's new UltraDry 30 provides silicon drift detection (SDD) technology with a larger active area (30 mm2). This enables high data throughput with the convenience of no-LN operation. The 30 mm2 active area also means that you can reduce beam currents while still getting sufficient statistics, and reduce sample damage. A new UltraDry 10+ and our standard UltraDry SDD detector are also available.
EDS Feature Sizing with Chemical Typing
Feature Sizing can measure dozens of parameters in a particle, including its area, its length and width, and its projections and inclusions. These measurements give you valuable information about the sample and can help determine its quality for industrial applications.
Feature Sizing with Chemical Typing (891 Kb)
COMPASS Option for the NORAN System SIX
COMPASS analyzes every energy channel (tens of thousands) in a Spectral Imaging data set, automatically determining the number of distinct chemical constituents. Those components important for analysis (typically chemical phases) are retained. These abstract principal components are converted into meaningful "pure" components, reported by COMPASS as a component image/spectrum pairs.
COMPASS Product Specification (208 Kb)
Research and Industrial Clients - Contact Us
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Gary Chandler: 520-621-6078, gwc@u.arizona.edu |
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